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TTTC's Electronic Broadcasting Service |
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IEEE INTERNATIONAL WORKSHOP on DEFECTS, ADAPTIVE TEST, YIELD AND DATA ANALYSIS
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CALL FOR PARTICIPATION |
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THEME: “Toward Real Time Understanding” The scope of the DATA workshop once again returns to our common theme, which has always been DATA, specifically, semiconductor test and yield data. We in the semiconductor industry create billions of data points every hour, and we’ve made great strides in capturing, storing, and analyzing these data. As the cost of storage falls, and query and analysis capabilities become ever more powerful, the next horizon for DATA professionals is Real Time Understanding. How quickly can we turn our copious data from wafer sort, final test, in-line defect inspection, etc. into an understanding that leads to immediate or even pre-emptive action? The time and cost pressures we’re facing as an industry make the move towards short-loop process improvement an imperative. |
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Thursday November 17, 2016 4:00-4.10pm: Opening remarks
4:10-5:00pm: Keynote "Is this the Big Data Inflection Point?"Bertrand Renaud, CEO of Galaxy Semiconductor and General Manager, Mentor Graphics 5:00-6:30pm: Panel Discussion “Obstacles to Real Time Understanding of Semiconductor Fab and Test Data” Panel Moderator: Anne Meixner, Consultant Participants:
6:30-7:00pm: Table top demonstrations Mentor Graphics, Optimal Plus, Qualtera 7:00-9:00pm: Reception Friday November 18, 2016 8:00-10:00 am: Big Data and Test: What do the Experts think? 8:00-8:40am: “Using OEE Data to Drive Manufacturing Excellence at Test”, Dale Ohmart, Texas Instruments 8:40-9:20 am: "Real-Time Big Data Collection and Analytics for Enhancing Quality, Yield and Manufacturing Control", Paul Simon, Qualtera 9:20-10:00am: "Cognitive Computing and Test”, Anne Gattiker, IBM 10:00-10:30 am Break 10:30am-12:00 noon: Technical Paper Session 1
12:00 noon-1pm: Lunch 1:00-2:30pm: Technical Paper Session 2
2:30-2:50pm: Break 2:50-4:10pm: Technical Paper Session 3
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| Additional Information | |
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General Information: Jennifer DworakSouthern Methodist University, USA. E-mail: jdworak@lyle.smu.edu Technical Program Submissions: Arani Sinha Intel, USA. E-mail: Arani.Sinha@INTEL.com | |
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GENERAL CHAIR Jennifer Dworak, SMU PROGRAM CHAIR Arani Sinha, Intel VICE-PROGRAM CHAIR Wesley Smith, Galaxy FINANCE CHAIR Sagar Kekare, KLA-Tencor PUBLICITY & WEB CHAIR Sankaran Menon, Intel PUBLICATIONS CHAIR Chintan Patel, UMBC PANEL CHAIR Anne Meixner, The Engineers' Daughter LLC LOCAL ARRANGEMENTS David Park, Optimal+ TEST STANDARDS CHAIR Al Crouch, SiliconAid EU LIAISON Rene Segers, Qualtera STEERING COMMITTEE Jeffrey Roehr, Texas Instruments Sankaran Menon, Intel Adit Singh, Auburn Univ. M. Tehranipoor, U CT Hank Walker, Texas A&M Hans Manhaeve, Q-Star Test Jim Plusquellic, U. NM PROGRAM COMMITTEE Rob Aitken, ARM Nemat Bidokhti, Cisco Sreejit Chakravarty, Intel John Carulli, Global Foundries Patrick Girard, LIRMM, France Ajay Khoche, Consultant Mike Laisne, Qualcomm Amit Nahar, TI Suriyaprakash Natarajan, Intel Jay Orbon, Consultant John Potter, Asset-Intertech Rajesh Raina, NXP Claude Thibeault, ETS, Canada Li C. Wang, UCSB Xiaoqing Wen, KIT, Japan Qiang Xu, CUHK, Hong Kong |
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| For more information, visit us on the web at: Conference website: http://DATA.tttc-events.org/ |
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DATA 2016 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society- Test Technology Technical Council |
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